Technical Service
Microstructural Characterization
With multi-scale, multi-dimensional, extreme environment in-situ tissue structure characterization and micro-nano processing capabilities, we are committed to the functional development and joint use of microscopic characterization equipment to provide one-stop, all-round tissue analysis solutions for materials.
Typical Equipment
Time-of-flight secondary ion mass spectrometer, X-ray microscope, scanning electron microscope, focused ion beam scanning electron microscope, transmission electron microscope, etc.
Time-of-flight secondary ion mass spectrometer (TOF-SIMS)
Function: TOF-SIMS system has a wide range of applications, such as semiconductors, microelectronics, thin films, nanomaterials, chemistry, medicine, biology, metallurgy, batteries and other fields. It is widely used in research applications such as trace metal detection, compound structure determination, precise atomic weight determination, isotope calibration, and failure analysis.
Features: TOF-SIMS is a surface analysis technique with shallower depth of analysis (typically less than 2 nm), which is more suitable for compositional analysis of ultrathin layers and nanoscale sample features.TOF-SIMS technology can analyze all elements including hydrogen and compounds including organic macromolecules with high mass resolution (>15000) and very high detection limits ( The ToF-SIMS technology can analyze all elements including hydrogen and compounds such as organic macromolecules with high mass resolution (>15000) and very high detection limits (ppm~ ppb scale).
Zeiss X-ray 3D CT Microscope Xradia 620 Versa (CT)
Functions: Characterize three-dimensional structures; observe failure mechanisms, degradation phenomena and internal defects; study sample properties at multiple scales; quantify microstructural evolution; perform in-situ imaging;
Spatial resolution: 0.5μm; scanning angle 360°.
Cold-field ultra-high resolution field emission scanning electron microscope SU8600
Resolution: up to 0.6nm at 15kV
Features: High-brightness electron source, four-stage ultra-high vacuum system
Featured configuration: scanning transmission probe (STEM), windowless energy spectrometer probe (EDS)
Sample compartment: Extra-large sample exchange compartment, compatible with 6-inch samples for quick sample change as well as mainframe cleaning function.
General Purpose Field Emission Scanning Electron Microscope Sigma360
Resolution:Up to 1nm or less at 15kV
Features:beam booster technology, easily realizing low voltage observation of various samples
Featured Configuration:Energy Spectroscopy probes, in combination, can be used to obtain more comprehensive information about the composition of a material.
Contact Us
Telephone
Address
Nanopolis Suzhou, No.99 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China
Telephone
Address
Nanopolis Suzhou, No.99 Jinji Lake Avenue, Suzhou Industrial Park, Suzhou, China
